Oslo node:

Ultra-High Vacuum (UHV) X-Ray Photoelectron Spectroscopy (XPS)

Model: KRATOS AXIS ULTRA DLD

Location: MiNaLab, Oslo

Contact: Spyros Diplas; Martin Sunding; Ingvild Jensen

Angle-Resolved (AR) X-Ray Photoelectron Spectroscopy (XPS)

Model: Thermo Scientific Theta-Probe

Location: MiNaLab, Oslo

Contact: Spyros Diplas; Martin Sunding; Ingvild Jensen

Temporal Analysis of Products (TAP)

Model: Mithra Technologies TAP-3E

Location: UiO, Oslo

Contact: Unni Olsbye; Evgeniy Redekop

Time-of-Flight Secondary Ion Mass-Spectrometer (ToF-SIMS)

Model: PHI nanoTOF/FIB

Location: MiNaLab, Oslo

Contact: Børge Holme; Stephan Kubowicz

High-pressure Reactor Scanning Tunneling Microscope (Reactor STM)

Model: LPM- Leiden Probe Microscopy B.V. ReactorSTM

Location: UiO, Oslo

Contact: Anja Olafsen Sjåstad; Oleksii Ivashenko

Trondheim node:

Ultra-High Vacuum (UHV) X-Ray Photoelectron Spectroscopy (XPS)

Model: KRATOS AXIS ULTRA DLD

Location: Gløshaugen, Trondheim

Contact: Ingeborg-Helene Svenum

Scanning-Tunneling Microscope (STM)

Model:

Location: , Trondheim

Atomic Force Microscope (AFM)

Model:

Location: , Trondheim

Auger Electron Spectroscopy (AES)

Model: JEOL JAMP-9500F FE Auger Microprobe

Location: Gløshaugen, Trondheim

Contact: Ingeborg-Helene Svenum